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iec 60335 2 64 test probe b

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IEC 60335-2-64 Test Probe B Of IEC 61032 With Circular Stop Face With A Diameter Of 56 Mm

China IEC 60335-2-64 Test Probe B Of IEC 61032 With Circular Stop Face With A Diameter Of 56 Mm on sale
IEC 60335-2-64 Test Probe B Of IEC 61032 With Circular Stop Face With A Diameter Of 56 Mm Parameter: 1,Jointed Finger Length:120mm(30/30/60mm); 2,Dam-board Diameter:56mm; 3,Standard:IEC60335-2-14|EN60335-2-14|GB4706.30 IEC60335-2-14|EN60335-2-14...
KingPo Technology Development Limited

Address: RM C, 13/F, HARVARD COMMERCIAL BUILDING, 105-111 THOMSON ROAD, WAN CHAI, HK

IEC 60335-2-64 Similar Test Probe B But Having A Circular Stop Face With Diam 56mm

China IEC 60335-2-64 Similar Test Probe B But Having A Circular Stop Face With Diam 56mm on sale
IEC 60335-2-64 Similar Test Probe B But Having A Circular Stop Face With Diam 56mm Product information: This test probe meets the requirements of IEC 60335-2-64 clause20.2, etc. Test probe similar to that of probe B of IEC 61032 but having a circular stop face with a diameter of 56mm instead of the non-circular face. Technical parameters: Model SN2210-2D Name Test Probe......
Sinuo Testing Equipment Co. , Limited

Address: Room 101, 1st Floor, No. 6, Third Street, Pingshan Industrial Zone 511495, Shibi Street, Panyu District, Guangzhou, China

30mm Home Appliance Testing Equipment Test Probe 41 Of IEC 61032

China 30mm Home Appliance Testing Equipment Test Probe 41 Of IEC 61032 on sale
IEC 60335-1 Home Appliances Testing Equipment Test Probe 41 of IEC 61032 Standard of Electrical Appliance Testing Equipment: IEC 60335-1: 2020 Household and similar electrical appliances – Safety – Part 1: General requirements clause 8.1.3; IEC 61032 ......
Guangzhou HongCe Equipment Co., Ltd.

Address: No.6-39, Yaogu Farm, Shibi No.3 Village, Shibi Street, Panyu District, Guangzhou

IEC 60529-2001 Unjointed Rigid Test Finger with 50N Force Thrust

China IEC 60529-2001 Unjointed Rigid Test Finger with 50N Force Thrust on sale
The Rigid Test Finger is a precision test probe made according to Figure 7 (Fig. 7) of the IEC 61032 (Test probe 11) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL. IEC 60335, IRAM 4220-1 and in most of the rules ......
HK LEE HING INDUSTRY CO., LIMITED

Address: 7F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China

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Products: IEC 60529-2001 Unjointed Rigid Test Finger with 50N Force Thrust

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